Eclipse.org
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<testdelay> element |
Device Kit Attributes Elements XML Reference |
Content type: unsignedLong
Examples: testdelay examples
| Sibling Name | Sibling Description |
|---|---|
| <description> | Description of the adapter test. |
| <deprecated> |  Specifies that the contents of this element should be marked as deprecated. |
| <provider> | Specifies the provider. |
| <version> | Specifies the version level. The format of the version number should be n.n.n where n is a number. For example, 1.0.0 is a valid version. |
| <vendor> | Specifies an implementing vendor. |
| <spec> | Hardware specification documentation for this adapter. |
| <send> | Specifies the message(s) to send during the test. |
| <adapter> | Specifies the adapter to be tested. |
| <testcount> | Unsigned integer that specifies the number of times to execute tests. |
| <junit> | Specifies a junit test. Currently, not supported. |
| <monitor> | Specifies a monitor test. Currently, not supported. |
| <playback> | Specifies a playback test. Currently, not supported. |
| <testcase> | Specifies a junit testcase. |
| <bundle> | Specifies an Open Services Gateway Initiative (OSGi) bundle should be created. |
| <managedbundle> | Specifies an Open Services Gateway Initiative (OSGi) managed bundle should be created. |
| <managedfactorybundle> | Specifies an Open Services Gateway Initiative (OSGi) managed factory bundle should be created. |
| Element Name | Element Description |
|---|---|
| <dkml> | Specifies the root element of a Device Kit Device Kit Language (dkml) document. |
| ¦--<adaptertest> | Specifies an adapter test. |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test. |
| ¦--<agenttest> | Specifies an agent test. |
| ¦ ¦--<agentmodeltest> | Specifies the agent model test. |
| ¦ ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| ¦--<agentmodeltest> | Specifies an agent model test.(see agentmodeltest) |
| ¦--<concretetest> | Specifies a concrete test. |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| ¦--<connectiontest> | Specifies an connection test. |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| ¦--<devicetest> | Specifies a device test. |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| ¦--<profiletest> | Specifies a profile test. |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| ¦--<transporttest> | Specifies a transport test. |
| ¦ ¦--<testdelay> | Specifies the milliseconds to sleep between each test.(see testdelay) |
| Copyright (c) IBM 2007. | Device Kit XML Reference 1.0.0 |