Eclipse.org|
Eclipse.org |
org.eclipse.soda.dk.epcglobal.llrp.device.test.factory | Epcglobal Llrp |
|
Epcglobal Llrp bundles packages |
org.eclipse.soda.dk.epcglobal.llrp.device.test.factory Bundle Properties
#########################################################################
# Copyright (c) 2007, 2009 IBM. #
# All rights reserved. This program and the accompanying materials #
# are made available under the terms of the Eclipse Public License v1.0 #
# which accompanies this distribution, and is available at #
# http://www.eclipse.org/legal/epl-v10.html #
# #
# Contributors: #
# IBM - initial API and implementation #
#########################################################################
bundle.category=device
bundle.copyright=Copyright (c) 2007, 2009 IBM.
bundle.description=Epcglobal Llrp Device Test Factory
bundle.name=EpcglobalLlrpDeviceTestFactory (Incubation)
bundle.vendor=Eclipse.org
id=ID
id_description=The identifier.
idimportfilter=Import Service Filter
idimportfilter_description=The import service filter.
idname=Name
idname_description=The name prefix.
prefix=Prefix
prefix_description=The notification prefix.
testcount=Test count
testcount_description=Test count.
testdelay=Test delay
testdelay_description=Test delay.
testexecute=Test execute
testexecute_description=Test execute commands.
testexecuteread=Test execute read
testexecuteread_description=Test execute read measurements.
testexecutewrite=Test execute write
testexecutewrite_description=Test execute write measurements.
testread=Test read
testread_description=Test read measurements.
testtrigger=Test trigger
testtrigger_description=Test trigger signals.
typename=EPCglobal Low Level Reader Protocol (LLRP) Device Factory
typename_description=The settings that may be configured.
| Key | Value |
|---|---|
| bundle.category | device |
| bundle.copyright | Copyright (c) 2007, 2009 IBM. |
| Copyright (c) 2007, 2008 IBM. | |
| bundle.description | Epcglobal Llrp Device Test Factory |
| EPCglobal Low Level Reader Protocol (LLRP) Device Factory | |
| bundle.name | EpcglobalLlrpDeviceTestFactory (Incubation) |
| bundle.vendor | Eclipse.org |
| id | ID |
| id_description | The identifier. |
| idimportfilter | Import Service Filter |
| idimportfilter_description | The import service filter. |
| idname | Name |
| idname_description | The name prefix. |
| prefix | Prefix |
| prefix_description | The notification prefix. |
| testcount | Test count |
| testcount_description | Test count. |
| testdelay | Test delay |
| testdelay_description | Test delay. |
| testexecute | Test execute |
| testexecute_description | Test execute commands. |
| testexecuteread | Test execute read |
| testexecuteread_description | Test execute read measurements. |
| testexecutewrite | Test execute write |
| testexecutewrite_description | Test execute write measurements. |
| testread | Test read |
| testread_description | Test read measurements. |
| testtrigger | Test trigger |
| testtrigger_description | Test trigger signals. |
| typename | EPCglobal Low Level Reader Protocol (LLRP) Device Factory |
| typename_description | The settings that may be configured. |
org.eclipse.ohf
plugins
org.eclipse.soda.dk
org.eclipse.soda.dk.epcglobal.llrp
org.eclipse.soda.dk.epcglobal.llrp.device.test.factory
OSGI-INF
l10n
bundle.properties
(1.6)
| Tag(s) | Timestamp | Revision | Comment |
|---|---|---|---|
| V1_2_0_2009_09_29 .. V1_2_0_2008_01_08_E3_3_2 | 2009-01-07 | 1.6 | |
| V1_2_0_2008_01_05_E3_3_2 .. V1_2_0_2008_09_30 | 2008-09-29 | 1.5 | |
| Eclipse3_3 | 2008-01-18 | 1.4 | |
| V1_1_0_2008_01_12 .. V1_1_0_2008_01_11 | 2008-01-11 | 1.3 | |
| V1_1_0_2008_01_03 .. V1_1_0_2007_12_03 | 2007-11-30 | 1.1 | First commit of LLRP implementation |
| Copyright (c) 2009 IBM. See license in Legal section. | Epcglobal Llrp Bundle Reference 1.2.0 |